A Novel approach for Fault Tolerant Nano Memory Applications

NANOTECHNOLOGY provides smaller faster and lower energy devices which allow more powerful and compact circuitry; However these benefits come with a cost—the nanoscale devices may be less reliable. Thermal- and shot-noise estimations alone suggest that the transient fault rate of an individual nanoscale device (e.g. transistor or nanowire) may be orders of magnitude higher than today’s devices. A failure is said to have occurred in a circuit or system if it deviates from its specified behavior. A fault on the other hand is physical defect which may or may not cause a failure. The failure rate also known as the hazard rate and defined as number of failures per unit time compared with the number of surviving components. A fault is characterized by its nature value extent & duration.