A Practical Guide to Transmission Electron Microscopy

Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope the imaging resolution is at several hundred nanometers and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM however can routinely reach several angstroms on a modem instrument. In addition the TEM can also provide material structural information since the electrons penetrate through the thin specimens and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user starting from the beginner level including upper-division undergraduates graduates researchers and engineers on how to learn TEM efficiently in a short period of time. It covers most of the areas using TEM including the instrumentation sample preparation diffraction imaging analytical microscopy and some newly developed advanced microscopy techniques. This book may serve as a textbook for a TEM course or workshop or a reference book for the TEM user to improve their TEM skills.