A Practical Guide to Transmission Electron Microscopy Volume II

Transmission Electron Microscope (TEM) is a very powerful tool for characterizing various types of materials. Using a light microscope the imaging resolution is at several hundred nanometers and for a Scanning Electron Microscope (SEM) at several nanometers. The imaging resolution of the TEM however can routinely reach several angstroms on a modem instrument. In addition the TEM can also provide material structural information since the electrons penetrate through the thin specimens and chemical compositional information due to the strong electron-specimen atom interactions. This book provides a concise practical guide to the TEM user starting from the beginner level including upper-division undergraduates graduates researchers and engineers on how to learn TEM efficiently in a short period of time. Volume I covers the instrumentation sample preparation fundamental diffraction imaging analytical microscopy and some newly developed microscopy techniques. This book may serve as a textbook for a TEM course or workshop or a reference book for the TEM user to improve their TEM skills.