<p>Testing and characterizing of Analog to Digital Converter (ADC) is still a challenging concern for real time mixed signal analysis manufacturers and designers for consideration of factor like cost and time. The goal of such process is to validate in a short time whether a given ADC unite its performance requirements. ADC is an important device generally used in today’s advanced communication and electronics applications like: microwave system military applications satellite communication and medical application for interfacing analog electronics with digital electronics. The ADC testing is mainly resolute by three technologies: linear stimulus generation fast data capture and precision clock timing. The bottle neck analyzed in testing of recently high-performance ADCs is the linear signal generation as the present need of technologies on timing and data capture can handle the testing need of upcoming ADCs. For current high-resolution ADCs time for full-code INL and DNL test which is directly related with the cost is comparative long because of the large number of variables to be accurately measured. </p><p></p>
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