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About The Book
Description
Author(s)
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction NSOM Raman X-Ray Photo Spectroscopy UV-VIS- NIR Spectrosphotometer FTIR Spectroscopy and so forth.
Piracy-free
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Details
ISBN 13
9781032375113
Publication Date
-29-11-2024
Pages
-144
Weight
-215 grams
Dimensions
-156x234x8 mm
