CMOS Gate-Stack Scaling Materials Interfaces and Reliability Implications

To address the increasing demands of device scaling new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding from a chemistry and materials perspective the mechanism of interface formation and defects at interfaces for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability concerns for high-k/metal gate (basic physical models charge trapping etc.) while others cover characterization of the thin films and interfaces which comprise the gate stack. Topics include: advanced Si-based gate stacks; and alternate channel materials.