Examines all important aspects of integrated circuit design fabrication assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics quality and reliability and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate graduate and continuing-education students in these disciplines.
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