English
₹7139
(All inclusive*)
Paperback
Delivery Options
Please enter pincode to check delivery time.
*COD & Shipping Charges may apply on certain items.
Review final details at checkout.
Looking to place a bulk order? SUBMIT DETAILS
Delivery Options
Please enter pincode to check delivery time.
*COD & Shipping Charges may apply on certain items.
Review final details at checkout.
About The Book
Description
Author
Radiation defect generation by high-energy MeV electron irradiation of n- and p- type Si-SiO2 structure with different kind of oxides has been studied. The morphology changes of SiO2 oxide during MeV electrons irradiation was observed by AFM. Si+ ion implanted Si-SiO2 structures before and after MeV electron irradiation are presented. The redistribution of oxygen and silicon atoms and Si nanocrystal generation during MeV electron irradiation was observed by RBS/C and AFM techniques respectively. Optical properties photoluminescence and spectroscopic studies of SiOx films irradiated with MeV electrons are carried out also.
Piracy-free
Assured Quality
Secure Transactions
Fast Delivery
Sustainably Printed
Details
ISBN 13
9786138502845
Publication Date
-24-01-2019
Pages
-148
Weight
-200 grams
Dimensions
-150x220x8.2 mm
