Optical and Electrical Properties of Thickness Dependent CuS

For decades copper sulfide has been considered as the most superior optical and semiconductor material. An attempt has been made to prepare CuS thinfilms by simple chemical bath deposition method. The prepared samples were characterized by XRD UV and PL to identify and study its structural optical and electrical properties. Results of XRD analysis confirmed the formation of CuS of Covellite phase. Optical properties were studied and the material exhibits a bandgap ranges 1.6 eV to 1.2 eV. The PL and electrical characterization of the sample has been studied and discussed detail in this book.