Particles on Surfaces

This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics on spacecraft and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical chemical surface and colloid chemists materials scientists; polymers plastics electrical and electronics computer chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.