This Book is Out of Stock!
English
₹5035
₹5052
0.34% OFF
(All inclusive*)
Paperback
Delivery Options
*COD & Shipping Charges may apply on certain items.
Review final details at checkout.
Looking to place a bulk order? SUBMIT DETAILS
*COD & Shipping Charges may apply on certain items.
Review final details at checkout.
₹5035
₹5052
0% OFF
Paperback
Out Of Stock
All inclusive*
About The Book
Description
Author
Physical Measurement and Analysis of Thin Films (Progress in Analytical Chemistry) by E. M. Murt published by Springer US stands as a beacon of knowledge and inspiration. With its insightful content and engaging narrative style this book transcends genres offering something valuable for every reader.
Piracy-free
Assured Quality
Secure Transactions
Fast Delivery
Sustainably Printed
Details
ISBN 13
9781489959126
Publication Date
-07-12-2013
Pages
-208
Weight
-307 grams
Dimensions
-152x229x11.75 mm
