Proposed Mathematical Model for Predicting Military Electronic Equipment Component Failure Rates and Isolating Underlying Failure Causes

<p>A mathematical expression for combining the entire failure rate curve is derived based on the assumption that the failure population is composed of three subpopulations early chance and wear out. A graphical method is provided for separating the subpopulations and determining the parameters of the model. The expression is then applied to observed failure data in three detailed examples and in each case the model is shown to represent the observed data at the.05 significance level using the Kolmogorov-Smirnov Test. Two BASIC language computer programs are provided to simplify the use of the proposed model.</p><p>This work has been selected by scholars as being culturally important and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact and remains as true to the original work as possible. Therefore you will see the original copyright references library stamps (as most of these works have been housed in our most important libraries around the world) and other notations in the work.</p><p>This work is in the public domain in the United States of America and possibly other nations. Within the United States you may freely copy and distribute this work as no entity (individual or corporate) has a copyright on the body of the work.</p><p>As a reproduction of a historical artifact this work may contain missing or blurred pages poor pictures errant marks etc. Scholars believe and we concur that this work is important enough to be preserved reproduced and made generally available to the public. We appreciate your support of the preservation process and thank you for being an important part of keeping this knowledge alive and relevant.</p><br>