This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of - close packed structures including zinc sulphide silicon carbide and silver iodide.
Piracy-free
Assured Quality
Secure Transactions
Delivery Options
Please enter pincode to check delivery time.
*COD & Shipping Charges may apply on certain items.