RF and Time-domain Techniques for Evaluating Novel Semiconductor Transistors

<p>This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel modern transistors made of materials such as graphene carbon nanotubes and silicon-on-insulator and using new transistor structures.  The author explains how to use conventional RF and time- domain measurements to characterize the performance of the transistors. In addition he explains how novel  transistors may be subject to effects such as self-heating period-dependent output non-linearity susceptibility to short-term degradation DC-invisible structural defects and a different response to DC and transient inputs.  Readers will understand that in order to fully understand and characterize the behavior of a novel transistor there is an arsenal of dynamic techniques available. In addition to abstract concepts the reader will learn of practical tips required to achieve meaningful measurements and will understandthe relationship between these measurements and traditional conventional DC characteristics. <br></p>