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₹9957
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About The Book
Description
Author
This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.
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Details
ISBN 13
9783642618734
Publication Date
-13-12-2011
Pages
-320
Weight
-463 grams
Dimensions
-152x229x17.75 mm
