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About The Book
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Author(s)
Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices flat panel and mobile displays optical coating stacks biological and medical coatings protective layers and more. While several
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Details
ISBN 13
9781606507278
Publication Date
-16-12-2015
Pages
-194
Weight
-271 grams
Dimensions
-152x229x10.45 mm
Details
ISBN 13
:
9781606507278
Publication Date
:
16-12-2015
Pages
:
194
Weight
:
271 grams
Dimensions
:
152x229x10.45 mm
Publisher
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