The Effect of Microstructure on the Fretting Fatigue Behavior of Nickel Alloy IN-100

<p>This thesis studied the effect of microstructure on the fretting fatigue behavior of IN-100. First fretting and plain fatigue S-N curves were determined over a large range of applied stress at an identical R-ratio and for fretting tests with a constant contact load. It was found that fretting fatigue reduces the cycles to failure compared to plain fatigue. The half contact width was found for the specimens the crack initiation angle was found to be 40- and the crack initiation location was at the trailing edge of contact for the fretting specimens. Computational work included finding the stress profile in the contact region using an analytical method and finite element method. The analytical method computed half contact width and was found to be in good agreement with experimental half contact width. The stress profiles produced from each method were compared and found to be in good agreement. The stress state was used to find the Modified Shear Stress Range (MSSR) Parameter.</p><p>This work has been selected by scholars as being culturally important and is part of the knowledge base of civilization as we know it. This work was reproduced from the original artifact and remains as true to the original work as possible. Therefore you will see the original copyright references library stamps (as most of these works have been housed in our most important libraries around the world) and other notations in the work.</p><p>This work is in the public domain in the United States of America and possibly other nations. Within the United States you may freely copy and distribute this work as no entity (individual or corporate) has a copyright on the body of the work.</p><p>As a reproduction of a historical artifact this work may contain missing or blurred pages poor pictures errant marks etc. Scholars believe and we concur that this work is important enough to be preserved reproduced and made generally available to the public. We appreciate your support of the preservation process and thank you for being an important part of keeping this knowledge alive and relevant.</p>