Theoretical evaluation of reflectance in AL/SiO2 thin films

The improvement of the optical properties of a material such as reflectance involves the complex search for the optimal experimental parameters in the process of obtaining them. The use of computational software for the simulation of these thin film growth processes represents a substantial benefit due to the non dependence on a real system as well as the possibility of exploring a wider range of physical quantities involved. In addition there is a need in the automotive industry Varroc Lighting Systems© has been given the task of improving the reflectance of aluminized headlights so we carried out the development using NASCAM® software which uses the Monte Carlo kinetic method to develop a model of the physical system to be studied on a nanometric scale this will allow us to analyze the influence of different magnitudes that can affect the reflectance of the material.