<p>Demand for advanced X-ray scattering techniques has increased tremendously in recent years with the development of new functional materials. &nbsp;These characterizations have a huge impact on evaluating the microstructure and structure-property relation in functional materials. Thanks to its non-destructive character and adaptability to various environments the X-ray is a powerful tool being irreplaceable for novel in situ and operando studies. This book is dedicated to the latest advances in X-ray diffraction using both synchrotron radiation as well as laboratory sources for analyzing the microstructure and morphology in a broad range (organic inorganic hybrid etc.) of functional materials.</p>
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