X-Ray Interferometric Methods for Investigating Crystal Imperfections

The monograph is devoted to the development preparation and testing of X-ray train meter and measurement of X-ray wave train length using this instrument; development of X-ray experiments similar to Sagnac and Michelson - Gale experiments as well as the luminous Fiseau experiment permitting to detect the influence of the moving media and sources on X-ray interference patterns; to the development of X-ray diffraction stereometric topography of crystal imperfections using multiple interferometers; to the detection and investigation of structural distortions of semiconducting crystals caused by external influences; X-ray interferometry technique for measuring the refractive indices of some solid bodies and liquids and a high sensitivity radiographic method for studying the uniformity of density distribution in substances are created. The book is intended for a wide range of readers - scientists engineers and technicians undergraduate and graduate students involved in research in the fields of solid state physics material science as well as it may be of use to those involved in the manufacture of semiconducting devices.